When it comes to reliable high voltage measurements, there are a number of factors that can negatively affect measurement
Join us on November 18th as we explore how isolation in data acquisition can be used to overcome noise problems and safety hazards in high voltage measurement applications.
You will also learn about the following topics:
Bio: 2-3 Short Sentences about the presenter.
Speakers 1 Name
Mr. Jeff Melrose is the Principal Technology Strategist for Cybersecurity at Yokogawa Corporation of America and has over 20 years of experience in Computer Security. Prior to his assignment with Yokogawa, Mr. Melrose was a Principal Security Engineer at Lockheed Martin and Raytheon designing secure systems for the US Military.