Identifying and Overcoming Noise in Data Acquisition

Webinar Recording 


Have you ever captured noisy data to your PC, having to then use software to "massage" the data to try and yield useful results?

By identifying and reducing different sources of noise, you’ll increase your measurement accuracy and reliability to obtain your desired results. Join us for a 1-hour webinar and learn the basic sources of electrical noise in data-acquisition systems including power line, aliasing, common mode, and quantization noise. You will learn how to easily identify, isolate, and remove these noise sources to ensure measurement data is accurate and reliable.

The noise sources covered in this webinar include:

  • Quantization noise
  • A/D internal noise
  • Power line noise
  • Time Skew
  • Aliasing noise
  • Common mode noise
  • Radiated noise (EMI)

Speaker


Richard Patterson

Product Manager
Yokogawa

Bio: Richard Patterson has 12 years of industry experience in measurement, automation, test, and data acquisition. He completed his M.S. in Physics at The Ohio State University in 2004.

Speakers 1 Name

Speaker Title
Company

Mr. Jeff Melrose is the Principal Technology Strategist for Cybersecurity at Yokogawa Corporation of America and has over 20 years of experience in Computer Security. Prior to his assignment with Yokogawa, Mr. Melrose was a Principal Security Engineer at Lockheed Martin and Raytheon designing secure systems for the US Military.

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